Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified load or strain transmission device from specimen...
Reexamination Certificate
2009-12-07
2011-12-06
Caputo, Lisa (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified load or strain transmission device from specimen...
C073S782000
Reexamination Certificate
active
08069733
ABSTRACT:
A device for measuring electromechanical properties and microstructure of nano-materials under stress state comprises two bimetallic strips placed on an insulated metal ring plated with insulating paint, wherein the two bimetallic strips are placed in parallel or V-shaped to insulated metal ring on the same plane, one end of each bimetallic strip is fixed on the insulated metal ring, the other end of the bimetallic strip hangs inside of the insulated ring, the distance of two bimetallic strips were controlled within 0.002-1 mm. Also provided is a method for measuring electromechanical properties and microstructure of nano-materials under stress state.
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Han Xiaodong
Liu Pan
Yue Yonghai
Zhang Yuefei
Zhang Ze
Beijing University of Technology
Caputo Lisa
J.C. Patents
Roy Punam
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