Device and method for measuring at least one parameter of...

Details Device and method for measuring at least one parameter of... Device and method for measuring at least one parameter of...

2008-04-21

2009-12-08

Stafira, Michael P (Department: 2886)

Optics: measuring and testing

For size of particles

Reexamination Certificate

active

07630074

ABSTRACT:
A device and a method for measuring at least one parameter of particles in a fluid, the device having a radiation source and a radiation sensor, the device having a fluid region that is in contact with the fluid; the radiation source being provided for the emission of measuring radiation according to a first direction onto the fluid region, the radiation sensor being provided for the detection of a measuring radiation reflected away from the fluid region in a second direction; furthermore, the radiation sensor having a plurality of sensor elements; and the spectral sensitivity of different sensor elements being developed differently for a wavelength-sensitive detection of the reflected measuring radiation.

REFERENCES:
patent: 4441816 (1984-04-01), Hencken et al.
patent: 4664513 (1987-05-01), Webb et al.
patent: 4679939 (1987-07-01), Curry et al.
patent: 2004/0201845 (2004-10-01), Quist et al.
patent: 0 783 101 (1997-07-01), None

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