Device and method for maskless AFM microlithography

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Reexamination Certificate

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C250S307000, C250S306000, C073S105000, C264S485000

Reexamination Certificate

active

07141808

ABSTRACT:
The invention relates to a device and a method for maskless microlithography. Several microstructured cantilevers (2) are arranged in an array (26) and an actuator is integrated in each of the cantilevers (2) of the array (26). A power supply and control unit (24) is provided, said unit adjusting the distance of the cantilevers (6) relative to a surface (4) that is to be structured by means of an appropriate voltage. Every point of the needles (6) is connected to said power supply and control unit (24). In order to implement the inventive method, an array (26) with cantilevers, each of which carries a point of a needle (6), is brought into contact with a surface (4) to be structured in such a way that the points of the needles (6) are arranged close to the surface (4) to be structured.

REFERENCES:
patent: 5856672 (1999-01-01), Ried
patent: 6189374 (2001-02-01), Adderton et al.
Minne, S.C., et al., “Independent parallel lithography using the atomic force microscope”, J. Vac. Sci. Technol. B. 14(4), Jul./Aug. 1996, pp. 2456-2461.

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