Device and method for mapping the topography of an eye using ele

Details Device and method for mapping the topography of an eye using ele Device and method for mapping the topography of an eye using ele

1997-04-24

2000-06-27

Mai, Huy

Optics: eye examining, vision testing and correcting

Eye examining or testing instrument

Methods of use

351212, A61B 300

Patent

active

060798319

ABSTRACT:
In an inventive method for mapping the topography of an eye, elevation measurements of the eye are collected using a slit beam diffuse reflection system, such as an ORBSCAN.TM. device. An approximating b-spline surface is then fitted to the elevation measurements. Slope measurements of the eye are collected using a Placido-based reflective system, but the slope measurements are referenced to points on the b-spline surface, rather than to points approximated using the conventional constant curvature method, so the measurements have substantially improved accuracy. The elevation and slope measurements are then blended using weighted least squares fitting techniques. A new b-spline surface is fitted to the blended measurements, with the new surface having substantially improved accuracy in depicting the actual topography of the eye as a result of the elevation-improved accuracy of the slope measurements.

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Orbtek brochures, "Orbscan Total Anterior Chamber Eye Exam", 7 pages.

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