Image analysis – Applications
Patent
1993-12-10
1996-02-06
Huntley, David M.
Image analysis
Applications
378 53, 378 57, 382199, G01N 2302
Patent
active
054902185
ABSTRACT:
A device and method is provided for finding a specific material superimposed on an unknown background when the locations of the specific material and the background are unknown, for example, inside an item of baggage. The invention comprises exposing an area of an item to be inspected to x-rays of two substanitally different energies, making effective use of the characteristic material specific differences in photoelectric effect scattering and Compton scattering, and comparing the pairwise differential attenuation of the x-rays at nearby exposed subareas to determine whether differences in attenuation can be attributed to the presence of different amounts of the specific material overlying the respective subareas. The most probable subareas are indicated on a standard image on a monitor as being the most likely location of the overlying specific material.
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Krug Kristoph D.
Stein Jay A.
Taylor Adam L.
Huntley David M.
Vivid Technologies, Inc.
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