Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-11-21
2006-11-21
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S519000, C324S661000, C324S663000, C324S686000
Reexamination Certificate
active
07138805
ABSTRACT:
The present invention provides an inspection apparatus and an inspection method, capable of, when supplying an inspection signal to a circuit wiring, eliminating any need for a pin to be brought into contact with the circuit wiring and detecting any defects including an invisible microscopic defect. An inspection apparatus A for inspecting a circuit wiring of a circuit board100comprises a conductive member1adapted to be disposed on the side of one of surfaces of the circuit board100and to be supplied with an inspection signal, a signal source2for supplying the inspection signal to the conductive member1, a sensor unit3including a plurality of cells3ato be disposed the opposed to the conductive member1on the side of the other surface of the circuit board100, and a computer5for acquiring each signal appearing at the cells3ain response to the inspection signal supplied to the conductive member1.
REFERENCES:
patent: 5124660 (1992-06-01), Cilingiroglu
patent: 5424633 (1995-06-01), Soiferman
patent: 6703849 (2004-03-01), Ishioka et al.
Ishioka Shogo
Yamaoka Shuji
Dole Timothy J.
Nguyen Vincent Q.
OHT Inc.
Westerman, Hattori, Daniels & Adrian , LLP.
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