Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Reexamination Certificate
2005-10-25
2011-10-11
Patidar, Jay (Department: 2858)
Electricity: measuring and testing
Magnetic
With means to create magnetic field to test material
C324S235000, C324S242000
Reexamination Certificate
active
08035373
ABSTRACT:
It is possible to accurately and stably inspect a scratch in the vicinity of a surface of a cell external case formed by a cylindrical copper plate by using a simple device. The cell external case (1) is rotated around the center axis of the cylindrical shape by a rotation device (2) and a magnetic flux is applied to the rotating cell external case from both ends of a frame (4). When a scratch is present on the cell external case (1), leak magnetic flux is generated which is detected by a magnetic sensor (6) arranged in the vicinity of the cell external case (1) and displayed on a display device (12) via a signal processing device (11). Since the cylindrical cell external case (1) rotates around its center axis, the distance between its surface and the magnetic sensor (6) is not changed and a scratch can be detected stably.
REFERENCES:
patent: 3366874 (1968-01-01), Kuhne
patent: 3535624 (1970-10-01), Wood
patent: 3710236 (1973-01-01), Halsey et al.
patent: 4468619 (1984-08-01), Reeves
patent: 4594549 (1986-06-01), Smith et al.
patent: 4618823 (1986-10-01), Dahlheimer et al.
patent: 5028869 (1991-07-01), Dobmann et al.
patent: 5144234 (1992-09-01), Murata
patent: 5235275 (1993-08-01), Ando et al.
patent: 5293117 (1994-03-01), Hwang
patent: 5357198 (1994-10-01), Ando et al.
patent: 6320375 (2001-11-01), Cotton et al.
patent: 2003/0011363 (2003-01-01), Wayman et al.
patent: 2003/0038629 (2003-02-01), Yokota et al.
patent: 2007/0222438 (2007-09-01), Reeves
patent: 05-107240 (1993-04-01), None
patent: 08-304346 (1996-11-01), None
patent: 10-111210 (1998-04-01), None
patent: 11-30608 (1999-02-01), None
patent: 11-96981 (1999-04-01), None
patent: 2002-320925 (2002-11-01), None
Browdy and Neimark PLLC
Patidar Jay
Toyo Kohan Co. Ltd.
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