Device and method for evaluating a temperature

Details Device and method for evaluating a temperature Device and method for evaluating a temperature

2008-07-25

2011-12-06

Caputo, Lisa (Department: 2855)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

Reexamination Certificate

active

08070357

ABSTRACT:
A device having temperature evaluating capabilities, the device includes: (i) a temperature sensitive delay line that comprises multiple first type NMOS transistors and first type PMOS transistors; (ii) an configurable delay line that comprises second type NMOS transistors and second type PMOS transistors; wherein a process condition sensitivity of first type NMOS transistors and first type PMOS transistors substantially equals a process condition sensitivity of the second type NMOS transistors and second type PMOS transistors; wherein the configurable delay line is less sensitive to temperature than the temperature sensitive delay line; (iii) a phase detector, coupled to an output of the temperature sensitive delay line and to an output of the adjustable delay line, the phase detector is adapted to determine a difference between a delay introduced by the temperature sensitive delay line and a delay introduced by the adjustable delay line; and (iv) a controller, adapted to: (a) find a configuration of the configurable delay line that introduces a delay that substantially equals a delay introduced by the temperature sensitive delay line; and (b) determine a temperature of the temperature sensitive delay line in response to the found configuration.

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Chen et al., “A Time-to-Digital-Converter-Based CMOS Smart Temperature Sensor,” IEEE Journal of Solid-State Circuits, vol. 40, No. 8, Aug. 2005, pp. 1642-1648.

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