Device and method for discrete and continuous measurement of...

Details Device and method for discrete and continuous measurement of... Device and method for discrete and continuous measurement of...

2006-11-28

2006-11-28

Gutierrez, Diego (Department: 2859)

Thermal measuring and testing

Temperature measurement

Of molten metal

C374S125000, C374S139000, C266S099000

Reexamination Certificate

active

07140765

ABSTRACT:
A device (10) for continuous measurement of the temperature of molten metal in a furnace or recipient for its production and treatment comprises a heat analysis instrument (14) placed in a lance (12) which blows inert gas and/or high-pressure compressed air against a surface of metal slag (18) of a furnace or recipient (20).

REFERENCES:
patent: 3413852 (1968-12-01), Engel et al.
patent: 3596894 (1971-08-01), Duthion et al.
patent: 4022447 (1977-05-01), Griffiths
patent: 4106756 (1978-08-01), Rymarchyk et al.
patent: 4541617 (1985-09-01), Okane et al.
patent: 4619533 (1986-10-01), Lucas et al.
patent: 4650318 (1987-03-01), Pointer et al.
patent: 4730925 (1988-03-01), Chiba et al.
patent: 4865297 (1989-09-01), Gitman
patent: 5234200 (1993-08-01), Pirklbauer et al.
patent: 5302027 (1994-04-01), Park
patent: 5447373 (1995-09-01), Okuhara
patent: 5585914 (1996-12-01), Yamasaki et al.
patent: 5830407 (1998-11-01), Cates
patent: 6071466 (2000-06-01), Cates et al.
patent: 6172367 (2001-01-01), Fritz et al.
patent: 6562287 (2003-05-01), Koester
patent: 6596995 (2003-07-01), Bender
patent: 6923573 (2005-08-01), Yamashita et al.
patent: 2003/0075843 (2003-04-01), Wunsche
patent: 2004/0178545 (2004-09-01), Cates
patent: 232 396 (1944-05-01), None
patent: 947587 (1999-10-01), None
patent: 62 005140 (1987-01-01), None
patent: 62 226025 (1987-10-01), None
patent: 62 293128 (1987-12-01), None
patent: 05 142049 (1993-06-01), None

Affiliated with

Also associated with

Rating

Device and method for discrete and continuous measurement of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device and method for discrete and continuous measurement of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and method for discrete and continuous measurement of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3669379