Device and method for determining impurities in a gas

Details Device and method for determining impurities in a gas Device and method for determining impurities in a gas

1989-03-06

1992-12-01

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

G01J 3443, G01N 2167

Patent

active

051683237

ABSTRACT:
A device for determining small amounts of impurities in gases comprises a measuring cell in which an arc is generated with a low frequency alternating voltage source between two electrodes. The emission spectrum of the arc is observed by means of interference filters and photosensors and the concentrations of the impurities are determined in the electronic evaluation unit for the spectral intensities typical of the impurity traces. The device is suitable for the continuous measurement of small quantities of gaseous impurities for example traces of nitrogen, argon, neon, water vapor, gaseous hydrocarbon, in helium.

REFERENCES:
patent: 2509649 (1950-05-01), Norman
patent: 2855820 (1958-10-01), Robinson
patent: 3951607 (1976-04-01), Fraser
patent: 4801209 (1989-01-01), Wadlow
R. Ikan, et al., Organic Chemistry: Compound Detection, Encyclopedia of Physical Science and Technology, vol. 10, pp. 43 and 54-56.
R. J. Walker, Detector for Trace Amounts of Nitrogen in Helium, Cryogenics, vol. 26, May 1986, pp. 297-299.

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