Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate
2005-02-12
2008-11-18
Stafira, Michael P (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
C356S239700
Reexamination Certificate
active
07453563
ABSTRACT:
The invention relates to a device and a corresponding method for detecting scratches on the surface (2) of a material, in particular glass. Said device comprises an illumination unit (3) and a recording unit (4), which register a scanning line (6) on the surface (2) of the material and can be displaced in relation to said surface (2). In order to more accurately identify scratches, the illumination unit (3) comprises at least one light strip (9), which generates parallel light pools transversally to the scanning line (6), said pools being diffuse or quasi-diffuse along the scanning line (6) and preferably at least one light source (16), which generates a diffuse or quasi-diffuse light transversally to the scanning line (6).
REFERENCES:
patent: 3814946 (1974-06-01), Takahashi et al.
patent: 5598262 (1997-01-01), Jutard et al.
patent: 5745176 (1998-04-01), Lebens
patent: 2 261 460 (1974-06-01), None
patent: 693 07 722 (1997-06-01), None
Pingel Ulrich
Rudert Armin
Isra Surface Vision GmbH
Stafira Michael P
Striker Michael J.
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