Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate
2008-05-06
2008-05-06
Bennett, G. Bradley (Department: 2859)
Geometrical instruments
Gauge
Movable contact probe, per se
C033S503000
Reexamination Certificate
active
11597445
ABSTRACT:
In a device and a method for coordinate measurement, a probe head generates a switching signal in response to contact with a workpiece. The device includes position-measuring units for each coordinate axis to be measured, with the aid of which the relative position of the probe head is measurable; and a processing unit, which operates in a discrete-time manner in time intervals of a controller clock signal. For coordinate measurement, position-measuring values are measured in time intervals of a probing clock signal, which is generated by a probing clock generator and has a higher frequency than a controller clock signal of a processing unit. The position-measuring values are stored in a position-data memory. A time span between a pulse of the controller clock signal and the occurrence of the switching signal at the switching probe head is measured in a time-measuring unit. With the aid of the measured time span, the position value in the position-data memory closest to the time of the switching signal is ascertained in the processing unit or in the position-measuring units.
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International Search Report,PCT International Patent Application No. PCT/EP2005/003966, dated Aug. 2, 2005.
Hagl Rainer
Reiter Herbert
Strasser Erich
Dr. Johannes Heidenhain GmbH
Kenyon & Kenyon LLP
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