Device and method for cleaning photomask

Cleaning and liquid contact with solids – Processes – Using sequentially applied treating agents

Reexamination Certificate

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C134S002000, C134S003000, C134S019000, C134S027000, C134S028000, C134S029000, C134S030000, C134S034000, C134S036000, C134S041000, C134S042000

Reexamination Certificate

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11276974

ABSTRACT:
Disclosed herein is a device and a method of cleaning a photomask, which prevents haze from being generated on a surface of the photomask during a photolithography process. The photomask is heat treated to remove residual ions on a surface thereof and to induce curing and oxidation of Cr and MoSiON layers, thereby preventing diffusion of the ions. Etching of Cr and MoSiON layers due to a cleaning process is suppressed in order to significantly reduce a change in phase and transmissivity of optical properties of Cr and MoSiON.

REFERENCES:
patent: 6071376 (2000-06-01), Nagamura et al.
patent: 6162565 (2000-12-01), Chao et al.
patent: 6209553 (2001-04-01), Nagamura et al.
patent: 2002/0155360 (2002-10-01), Tange et al.
patent: 2006/0137717 (2006-06-01), Lee
patent: 2006/0207633 (2006-09-01), Kim et al.

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