Device and method for analyzing ions of high mass

Details Device and method for analyzing ions of high mass Device and method for analyzing ions of high mass

1991-05-31

1993-04-13

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

250283, 250287, B01D 5944, H01J 4900

Patent

active

052025616

ABSTRACT:
Detector device for analyzing ions of high mass using a time-of-flight (TOF) analytical method, consisting of a mass spectrometer 1, accelerating electrodes 2 and a magnetic field and/or electric field, all of which serves to deflect secondary ions 5 emerging from a first conversion dynode 8, so that the secondary ions impinge according to polarity on a second 7 and third 7' conversion dynode.

REFERENCES:
patent: Re33344 (1990-09-01), Stafford et al.
patent: 3898456 (1975-08-01), Dietz
patent: 4267448 (1981-05-01), Feser et al.
patent: 4423324 (1983-12-01), Stafford
patent: 4766312 (1988-08-01), Fergusson et al.
patent: 4810882 (1989-03-01), Bateman
patent: 4835383 (1989-05-01), Mahoney et al.
patent: 4988867 (1991-01-01), Laprode
patent: 4988868 (1991-01-01), Gray
patent: 4996422 (1991-02-01), Mitsui et al.

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