Device and method for analyzing EMI noise and semiconductor...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Power system

Reexamination Certificate

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C703S016000, C716S030000, C345S440000

Reexamination Certificate

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06842727

ABSTRACT:
A technique for effectively attenuating EMI noise, which is generated from the electric power system of semiconductor devices, is described. In accordance with the technique, a power supply netlist with an additional electric current source(s) is generated by adding block power supply current waveform data, as extracted from test vector data and a block netlist, to the power supply netlist as extracted from the layout data of the circuit under analysis. A circuit simulation of the power supply netlist with an additional electric current source(s) is then performed in order to calculate power supply current/voltage waveform data. Furthermore, current/voltage spectral data is calculated by the Fourier transformation of the power supply current/voltage waveform data followed by displaying the current/voltage spectral data as the result of the Fourier transformation.

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