Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Reexamination Certificate
2005-02-22
2005-02-22
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
C250S491100, C250S492200, C250S492300, C702S155000
Reexamination Certificate
active
06859741
ABSTRACT:
The invention relates to an apparatus and to a method for adapting the size of an ion beam spot in tumor irradiation. For that purpose, the apparatus has a raster scanning device composed of raster scanning magnets (20) for raster scanning the ion beam (19). In addition, the apparatus comprises quadrupole magnets (10) determining the size of the ion beam spot, which quadrupole magnets (10) are arranged directly in front of the raster scanning magnets (20), and finally two magnet power supply units (18) for the quadrupole doublet of the quadrupole magnets (10) determining the size of the ion beam spot, the apparatus having a control loop for obtaining current correction values, by comparing desired and actual values of the prevailing dimension of the beam, for two magnet power supply units (18) of the quadrupole doublet arranged directly in front of the raster scanning magnets (20), for defined homogenization and/or for defined variation of the size of the ion beam spot.
REFERENCES:
patent: 5132544 (1992-07-01), Glavish
patent: 6476403 (2002-11-01), Dolinskii et al.
patent: 6677597 (2004-01-01), Haberer et al.
patent: 198 35 209 (2000-02-01), None
patent: 0 986 070 (2000-03-01), None
patent: 1 041 579 (2000-10-01), None
patent: 1 045 399 (2000-10-01), None
Haberer Thomas
Ott Wolfgang
Barlow John
Frommer & Lawrence & Haug LLP
Gesellschaft fuer Schwerionenforschung mbH
Le John
Santucci Ronald R.
LandOfFree
Device and method for adapting the size of an ion beam spot... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device and method for adapting the size of an ion beam spot..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and method for adapting the size of an ion beam spot... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3454677