Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1995-09-07
1998-04-28
Brock, Michael
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324642, G01N 2204
Patent
active
057449716
ABSTRACT:
A probe (1) is used to measure the dielectric properties of rigid or semi-rigid materials (4), for example, works of art. The probe comprises an inner conductor and an outer, coaxial, conductor separated by a layer of insulator e.g. Teflon (TM). The probe is coupled to a network analyzer (11), which provides microwave frequency radiation which is transmitted by the probe onto the surface of the material where it is reflected back from the surface back down the probe to the analyzer, where it is analyzed to give measurements on the dielectric properties of the material. The probe typically has an outside diameter of around 0.86 mm, and because of its size allows measurements to be made, non-invasively, and in real time on small areas of material. The outside diameter can be made of the order of microns by selecting the frequency of the radiation, which allows measurements to be made in a sample of a semi-rigid material e.g. a layer of paint for depth profiling. The probe has particular application in the measuring of works of art.
REFERENCES:
patent: 4544880 (1985-10-01), Nagy
patent: 5059914 (1991-10-01), Lacombe
patent: 5227730 (1993-07-01), King et al.
patent: 5233306 (1993-08-01), Misra
Athey et al. "Measurements of Radio Frequency Permittivity of Biological Tissues with an Open-Ended Coaxial Line: Part 1", IEEE Transactions on Microwave Theory and Techniques, pp. 82-86, vol. MTT-30, No. 1, Jan. 1982.
"Theoretical and Experimental Study of Measurement of Microwave Permittivity using Open Ended Elliptical Coaxial Probes" Y.Xu et al, 0018-9480/92503 1992 IEEE vol. 40, No. 1 Jan. 92, pp. 143-150.
Chan Tsing Yee Amy
Odlyha Marianne
Brock Michael
Dubno Herbert
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