Device and a method for biasing a transistor that is...

Details Device and a method for biasing a transistor that is... Device and a method for biasing a transistor that is...

2007-06-05

2007-06-05

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Calibration

C327S534000

Reexamination Certificate

active

10955219

ABSTRACT:
Biasing a transistor connected to a voltage converter, the method includes: (i) providing at least one bias voltage to at least one well of at least one transistor of a test circuitry; (ii) measuring at least one parameter of a test circuitry representative of at least one characteristic of the transistor and of at least one characteristic of the voltage converter; (iii) altering at least one bias voltage and repeating the stages of providing and measuring until a predefined control criteria is fulfilled; and (iv) providing a voltage bias to a well of the transistor in response to the measurements.

REFERENCES:
patent: 6448840 (2002-09-01), Kao et al.
patent: 6753719 (2004-06-01), Bhagavatheeswaran et al.
patent: 2002/0005750 (2002-01-01), Kao
patent: 2004/0113649 (2004-06-01), Berthold et al.

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