Device aging determination circuit

Details Device aging determination circuit Device aging determination circuit

2005-06-07

2005-06-07

Pert, Evan (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

06903564

ABSTRACT:
A device aging determination circuit. Circuits are located on a device, including a first circuit operating at a first duty cycle and generating a first output and a second circuit operating at a second duty cycle different from said first duty cycle and generating a second output. A measuring circuit determines a difference in the first output and the second output, wherein the difference indicates an aging of the device. The aging is a representation of how much degradation the device has been exposed to, and allows for dynamic adjustment of operating parameters of the device to optimize performance.

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patent: 6798230 (2004-09-01), Taylor et al.
patent: 2004/0148111 (2004-07-01), Gauthier et al.

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