Determining the quality and reliability of a component by...

Details Determining the quality and reliability of a component by... Determining the quality and reliability of a component by...

2007-10-16

2007-10-16

Wachsman, Hal (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S182000, C702S183000

Reexamination Certificate

active

11369293

ABSTRACT:
One embodiment of the present invention provides a system that tests the quality and/or the reliability of a component. During operation, the system applies test conditions to a plurality of specimens of the component. While applying the test conditions, the system measures the same variable from each of the plurality of specimens. Next, the system computes a running average of the measured variable across the plurality of specimens. The system then computes residuals between the measured variable for each specimen and the running average. The system next determines from the residuals whether the associated specimens are degraded.

REFERENCES:
patent: 4937763 (1990-06-01), Mott
patent: 6229329 (2001-05-01), Nakata et al.
patent: 6782500 (2004-08-01), Madge et al.

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