Coded data generation or conversion – Digital code to digital code converters – Serial to parallel
Reexamination Certificate
2006-11-03
2008-11-11
Williams, Howard (Department: 2819)
Coded data generation or conversion
Digital code to digital code converters
Serial to parallel
C375S355000, C370S506000
Reexamination Certificate
active
07450038
ABSTRACT:
In some embodiments, a chip includes sampling circuitry to produce oversampled data from a received signal, and logic to determine which of the oversampled data are to be part of different unit intervals, wherein some of the unit intervals have a number of oversampled data that is different than a number of oversampled data typically included in the unit intervals. Other embodiments are described and claimed.
REFERENCES:
patent: 6606360 (2003-08-01), Dunning et al.
patent: 6897793 (2005-05-01), Kim et al.
patent: 6907096 (2005-06-01), Lueker et al.
patent: 7149269 (2006-12-01), Cranford et al.
patent: 7236553 (2007-06-01), Choi
patent: 2004/0022196 (2004-02-01), Rivoir
patent: 2006/0222129 (2006-10-01), Hadzic et al.
patent: 2007/0280392 (2007-12-01), De Laurentiis et al.
Choi et al.—U.S. Appl. No. 10/763,905 filed Jan. 23, 2004—Reduced Dead-Cycle, Adaptive Phase Tracking Method and Apparatus.
“U.S. Appl. No. 11/856,640 Filed Sep. 17, 2008”, Whole Document.
Blakely & Sokoloff, Taylor & Zafman
Silicon Image Inc.
Williams Howard
LandOfFree
Determining oversampled data to be included in unit intervals does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Determining oversampled data to be included in unit intervals, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Determining oversampled data to be included in unit intervals will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4047693