Determining frequency components of jitter

Details Determining frequency components of jitter Determining frequency components of jitter

2008-03-25

2008-03-25

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

07349818

ABSTRACT:
A method of determining frequency components of jitter in a waveform is provided. The method includes conducting a plurality of locally-in-order strobings of the waveform. Changing the acquisition time associated with each locally-in-order strobing. Measuring jitter associated with each locally-in-order strobing and determining jitter as a function of frequency based on the measured jitter associated with each change of acquisition time.

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Hong et al., “An Efficient Random Jitter Measurement Techinique Using Fast Comparator Sampling”, “23rd IEEE VLSI Test Symposium”, pp. 123-130, Publisher: IEEE, Published in: Piscataway, NJ.
“Understanding and Characterizing Timing Jitter”, “www.tektronix.com/jitter”, 2003, pp. 1-24, Publisher: TEKTRONIX.

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