Determining defects in OLED devices

Details Determining defects in OLED devices Determining defects in OLED devices

2005-07-12

2005-07-12

Williams, Joseph (Department: 2879)

Electric lamp or space discharge component or device manufacturi

Process

With testing or adjusting

C315S169100

Reexamination Certificate

active

06916221

ABSTRACT:
A method of determining defects in OLED devices having a plurality of pixels, each with its own emissive layer, which are capable of being excited by input light to produce an output color light response, including illuminating one or more OLED devices or a portion of an OLED device with light in a predetermined portion of the spectrum so that the pixel emissive layers are excited to produce an output color response for each pixel, capturing an image of the output light produced by the excited pixels and converting such captured light into a digital image; and determining device pixel size, shape, location, and emitted light intensity from the digital image and comparing such size, shape, location, and emitted light intensity with predetermined acceptable size, shape, location, and emitted light intensity ranges to determine whether there is a defect in the OLED device(s).

REFERENCES:
patent: 4356429 (1982-10-01), Tang
patent: 4539507 (1985-09-01), VanSlyke et al.
patent: 4720432 (1988-01-01), VanSlyke et al.
patent: 4769292 (1988-09-01), Tang et al.
patent: 5742129 (1998-04-01), Nagayama et al.
patent: 2001/0048110 (2001-12-01), Hiroki
patent: 2002/0047565 (2002-04-01), Nara et al.
patent: 2002/0142697 (2002-10-01), Yamagata et al.
patent: 96236027 (1996-09-01), None
patent: 99329229 (1999-11-01), None
patent: 2001-116653 (2001-04-01), None
patent: 2003-257652 (2003-09-01), None
Ishii et al, Energy-level alignment at model interface of organic electroluminescent devices studied by UV photoemission: trend in thedeviation from the traditional way of estimating the interfacial electronic structures, IEEE Journal of Selected Topics in Quantum Eelectronics, Jan-Feb, 1998, IEEE, USA, vol. 4, No. 1, pp. 24-33.

Affiliated with

Also associated with

Rating

Determining defects in OLED devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Determining defects in OLED devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Determining defects in OLED devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3385681