Determining defective devices which generate sound during...

Details Determining defective devices which generate sound during... Determining defective devices which generate sound during...

2006-06-13

2006-06-13

Williams, Hezron (Department: 2856)

Measuring and testing

Vibration

By mechanical waves

C073S602000, C073S659000

Reexamination Certificate

active

07059191

ABSTRACT:
Determining whether a device is defective by analyzing the sound signals generated by the device. Digital samples are generated to represent the sound signals. Digital samples are transformed from the time domain to the frequency domain to generate a frequency spectrum. By comparing the levels of intensity at a corresponding frequency to the threshold levels of intensity, defective devices can be determined.

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Pending U.S. Appl. No. 09/517,986; filed March 3, 2000; entitledPage Address Look-Up Range RAM;Inventor: David R. Matt (Texas Instruments Incorporated TI-29809).

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