Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2007-12-25
2007-12-25
Mai, Huy (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
C351S222000, C351S246000
Reexamination Certificate
active
10475153
ABSTRACT:
Eye refraction is measured to achieve desired quality via a selected vision characteristics. A characteristic of vision is selected to correlate to the desired quality of vision from a group of vision characteristics comprising acuity, Strehl ratio, contrast sensitivity, night vision, day vision, and depth of focus, dynamic refraction over a period of time during focus accommodation, and dynamic refraction over a period of time during pupil constriction and dilation. Wavefront aberration measurements are used to objectively measure the state of the eye refraction that defines the desired vision characteristic. The measured state of refraction is expressed with a mathematical function enabling correction of the pre-selected vision characteristic to achieve the desired quality of vision. The mathematical expression function may be a Zernike polynomial having both second order and higher order terms or a function determined by spline mathematical calculations. Pre-selected vision characteristics may be determined using ray tracing technology.
REFERENCES:
patent: 3290927 (1966-12-01), Gambs
patent: 4190332 (1980-02-01), Body et al.
patent: 4465348 (1984-08-01), Lang et al.
patent: 4691716 (1987-09-01), Tanne
patent: 4778268 (1988-10-01), Randle
patent: 4796989 (1989-01-01), Fukuma et al.
patent: 5148205 (1992-09-01), Guilino et al.
patent: 5258791 (1993-11-01), Penney et al.
patent: 5293871 (1994-03-01), Reinstein et al.
patent: 5414478 (1995-05-01), van Gelderen
patent: 5418714 (1995-05-01), Sarver
patent: 5581405 (1996-12-01), Meyers et al.
patent: 5589897 (1996-12-01), Sinclair et al.
patent: 5722427 (1998-03-01), Wakil et al.
patent: 5841511 (1998-11-01), D'Souza et al.
patent: 5847804 (1998-12-01), Sarver et al.
patent: 5875019 (1999-02-01), Villani
patent: 5953100 (1999-09-01), Sarver et al.
patent: 6000800 (1999-12-01), Webb et al.
patent: 6004313 (1999-12-01), Shimmick et al.
patent: 6082856 (2000-07-01), Dunn et al.
patent: 6086204 (2000-07-01), Magnante
patent: 6199986 (2001-03-01), Williams et al.
patent: 6234631 (2001-05-01), Sarver et al.
patent: 6382795 (2002-05-01), Lai
patent: 6382797 (2002-05-01), Bille et al.
patent: 6409345 (2002-06-01), Molebny et al.
patent: 6428168 (2002-08-01), Sarver et al.
patent: 2003/0011745 (2003-01-01), Molebny et al.
patent: 63242219 (1988-10-01), None
patent: 98105286 (1998-07-01), None
patent: PCT/US99/23327 (1999-07-01), None
Wang Li et al, “Comparison of a ray0tracing refractometer, autorefractor, and computerized videokeratography in measuring pesudophakic eyes.”, XP002377279; US National Library of Medicine, Bethesda, MD; Feb. 2002.
Salchow D J et al; “Comparison of objective and subjective3 refraction before and after laser in situ keratomileusis” XP002377278. US National Library of Medicine (NLM), Bethesda, MD Jun. 1999.
Corneal Topography The State of the Art by James P. Gills, Donald R. Sanders, Spencer P. Thornton, Robert G. Martin, Johnny L. Gayton, Jack T. Holladay—Chapter 5—The EyeSys 2000 Corneal Analysis System by Spencer P. Thornton, M.D. FACS and Joseph Wakil, M.D. Mee.
EyeSys 2000 Corneal Analysis System: The Ultimate in Corneal Topography from the Proven Leader (Brochure). Copyright EyeSys Technologies, Inc., 1995.
EyeSys Vista: Hand-Held Corneal Topographer (Brochure).
Ophthalmic Terminology: Speller and Vocabulary Builder—Third Edition—by Stein, Slatt, and Stein.
Contact Lenses: Update 1—Chapter 4—Corneal Topgraphy by J. James Rowsey and David J. Schanzlin (Copyright 1986 by Little, Brouwn and Company).
Contact Lenses—Chapter 17—Measurement of Corneal Curvature: Keratometer (Ophthalmometer) by Oliver H. Dabezies, Jr. and Jack T. Holladay (Copyright 1984 by Little, Brown and Company.
A Comprehensive Guide to Fitting Contact Lenses with EyeSys Pro-Fit Contact Lens Fitting Software by Beth A. Soper, C.O.A. (EyeSys System 2000—Version 3.1).
M.S. Smirnov. Measurement and wave aberration of the eye. Biofizika (Biophysics USSR), 6, pp. 687 through 703 (previously pp. 776-794, 1961). English translation of: p. 690 translation of the last paragraph continuing onto p. 691, and on page 691 1st, 2ndand 3rdfull paragraphs.
Van de Brink. Measurement of the geometrical aberrations of the eye. Vision Res. 2, pp. 233-244, 1962.
N.M. Sergienko. Oftalmologicheskaya optika (Ophtalmic Optics). Moscow, Meditsina, 1991, 142 pages. English translation of: p. 30-32 text of the last paragraph referring to Figure 19 continuing onto pp. 31 and 32, and first full paragraph of p. 32.
R.H. Webb, C.M. Penney, and K.D. Thompson. Measurement of ocular local wavefront distortion with a spatially resolved refractometer. Applied Optics. 31, pp. 3678-3686, 1992.
S.G. El Hage and Bemi F. Contribution of the crystalline lens to the spherical aberration of the eye. J. Opt. Soc. Am. 63, pp. 205-211, 1973.
J. Liang, B. Grimm, S. Goelz, and J. F. Bille, Objective measurement of wave aberrations of the human eye with the use of a Hartmann-Shack wave-front sensor. J Opt. Soc. A. A 11, pp. 1949-1957, 1994.
J. Liang and D.R. Williams. Aberrations and retinal image quality of the normal human eye. J Opt. Soc. Am. A 14, pp. 2873-2883, 1997.
J. Liang, D.R. Williams and D.T. Miller. Supernormal vision and high resolution retinal imaging through adaptive optics, J. Opt. Soc. Am., A 14, pp. 2884-2892, 1997.
T. Seiler, P.J. McDonnell, “Excimer laser photorefractive keratectomy”, Surv. of Ophthalm., 40, pp. 89-118, 1995.
Eye Sys Technologies brochure, EyeSys Software The power that drives high performance corneal topography. EyeSys Technologies Inc., 1995.
W.D. West, OD. Corneal Topography: It's not just for surgeons anymore. Eyecare Technology, Jul./Aug. 1995.
Molebny Sergiy
Molebny Vasyl V.
Pallikaris Ioannis
Wakil Youssef
Adler Benjamin Aaron
Mai Huy
Tracey Technologies, LLC
LandOfFree
Determining clinical refraction of eye does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Determining clinical refraction of eye, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Determining clinical refraction of eye will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3894219