Determining capability of an on-line sensor

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C382S190000, C382S204000, C348S180000, C348S187000, C356S429000

Reexamination Certificate

active

07848561

ABSTRACT:
Devices, systems and methods for determining capabilities of an on-line sensor are disclosed. The exemplary method may comprise the following acts. The method may generate an image of a sample texture with known characteristics. The method may transfer the image to an on-line sensor. The method may also analyze data generated by the on-line sensor to determine measured characteristics. The method may compare the measured characteristics to the known characteristics.

REFERENCES:
patent: 4324459 (1982-04-01), Gerharz
patent: 4377338 (1983-03-01), Ernst
patent: 4628342 (1986-12-01), Desmons et al.
patent: 5317646 (1994-05-01), Sang, Jr. et al.
patent: 5383018 (1995-01-01), Sadjadi
patent: 5406070 (1995-04-01), Edgar et al.
patent: 5453840 (1995-09-01), Parker et al.
patent: 5764386 (1998-06-01), Robinson
patent: 5774519 (1998-06-01), Lindstrom et al.
patent: 5821993 (1998-10-01), Robinson
patent: 5884118 (1999-03-01), Mestha et al.
patent: 6063531 (2000-05-01), Singh et al.
patent: 6222934 (2001-04-01), Tsai
patent: 6437823 (2002-08-01), Zhang
patent: 6488353 (2002-12-01), Itoyama et al.
patent: 6654493 (2003-11-01), Hilliard et al.
patent: 6768958 (2004-07-01), Ivanovic et al.
patent: 6816187 (2004-11-01), Iwai et al.
patent: 6819789 (2004-11-01), Kantor et al.
patent: 6956203 (2005-10-01), Staton et al.
patent: 6985251 (2006-01-01), Okahashi et al.
patent: 7023473 (2006-04-01), Iwai et al.
patent: 7085408 (2006-08-01), Chung-Chi Jim
patent: 2002/0041383 (2002-04-01), Lewis et al.
patent: 2002/0198673 (2002-12-01), Koeberle et al.
patent: 2003/0210431 (2003-11-01), Rylander
patent: 2005/0083531 (2005-04-01), Millerd et al.
patent: 2005/0100205 (2005-05-01), Shishido et al.
patent: 2005/0146722 (2005-07-01), Torfs et al.
patent: 2005/0190961 (2005-09-01), Beaty et al.
patent: 2008/0019611 (2008-01-01), Larkin et al.
Reder, Alan. “Remote Diagnosis for Laboratory Instruments.” IVD Technology. IVD Technology, Jan 2001. Web. Aug. 10, 2010. <http://www.ivdtechnology.com/article/remote-diagnostics-laboratory-instruments>.
Sjodahl et al., Electronic Speckle Photography: Analysis of an Algorithm Giving the Displacement with Subpixel Accuracy, Applied Optics, vol. 32, No. 13, 1993, pp. 2278-2284.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Determining capability of an on-line sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Determining capability of an on-line sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Determining capability of an on-line sensor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4216946

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.