Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2006-04-11
2006-04-11
Gandhi, Jayprakash N. (Department: 2125)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S121000
Reexamination Certificate
active
07027885
ABSTRACT:
The invention is a technique by which a manufacturing process flow determines when to begin processing a batch of lots. The invention includes a method for determining whether to begin processing a batch in one aspect and a manufacturing process flow in a second aspect. The method comprises: ascertaining a respective time at which each of a plurality of additional lots will be received into the batch, the batch including a plurality of present lots; assessing a cost for a machine, each additional lot, and each present lot for each respective time at which each additional lot will be received should the machine begin processing the batch at the respective time; and determining the respective time at which the total cost borne by the machine, each additional lot, and each present lot will be at a minimum. The manufacturing process flow comprises a processing tool that processes batch-by-batch, a batch of present lots, a plurality of additional lots that may be included in the batch, and a software agent or a computing system. The software agent/computing system is capable of performing the method set forth above.
REFERENCES:
patent: 4796194 (1989-01-01), Atherton
patent: 5093794 (1992-03-01), Howie et al.
patent: 5249120 (1993-09-01), Foley
patent: 5258915 (1993-11-01), Billington et al.
patent: 5369570 (1994-11-01), Parad
patent: 5375061 (1994-12-01), Hara et al.
patent: 5444632 (1995-08-01), Kline et al.
patent: 5548535 (1996-08-01), Zvonar
patent: 5586021 (1996-12-01), Fargher et al.
patent: 5890134 (1999-03-01), Fox
patent: 5953229 (1999-09-01), Clark et al.
patent: 6038539 (2000-03-01), Maruyama et al.
patent: 6088626 (2000-07-01), Lilly et al.
patent: 6091998 (2000-07-01), Vasko et al.
patent: 6128542 (2000-10-01), Kristoff et al.
patent: 6148239 (2000-11-01), Funk et al.
patent: 6202062 (2001-03-01), Cameron et al.
patent: 6263255 (2001-07-01), Tan et al.
patent: 6356797 (2002-03-01), Hsieh et al.
patent: 6374144 (2002-04-01), Viviani et al.
patent: 6400999 (2002-06-01), Kashiyama et al.
patent: 6584369 (2003-06-01), Patel et al.
patent: 6782302 (2004-08-01), Barto et al.
patent: 6801819 (2004-10-01), Barto et al.
Resende, “Shop Floor Scheduling of Semiconductor Wafer Manufacturing,”University of California, Berkeley(1987).
Glassey et al., “Closed-Loop Release Control for VLSI Circuit Manufacturing,”IEEE Transactions on Semiconductor Manufacturing1:36-46 (1988).
“Agent-Enhanced Manufacturing System Initiative,”Technologies for the Integration of Manufacturing Applications(TIMA) (Oct. 1997).
Ehteshami et al.,“Trade-Offs in Cycle Time Management: Hot Lots”, IEEE Transactions on Semiconductor Manufacturing, vol. 5, No. 2, May 1992.
“Factory Integration,”The National Technology Raodmap for Semiconductors: Technology Needs(1997).
SALSA Enhancements for next Swarm Release (Apr. 22, 1999).
SALSA Exceptions—Minutes from May 11, 1999.
Starvation Avoidance Lot Start Agent (SALSA) (Overview: Apr. 15, 1999).
Starvation Avoidance Lot Start Agent,Fab25 AEMSI/SALSA Review Meeting(May 26, 1999).
Starvation Avoidance Lot Start Agent,Iteration 1 Requirements Kickoff(May 3, 1999).
Van Parunak, “Review of Axtell and Epstein” (Jun. 23, 1999).
Baumgärtel et al., “Combining Multi-Agent Systems and Constraint Techniques in Production Logistics” (1996).
Bonvik et al., “Improving a Kanban Controlled Production Line Through Rapid Information Dissemination” (Jul. 10, 1995).
Burke et al., “The Distributed Asynchronous Scheduler,” pp. 309-339 (1994).
Butler et al., “ADDYMS: Architecture for Distributed Dynamic Manufacturing Scheduling,” pp. 199-213 (1996).
Fordyce et al., “Integrating Decision Technologies for Dispatch Scheduling in Semiconductor Manufacturing,”Logistics Management System(LMS), pp. 473-516 (1994).
Hynynen, “BOSS: An Artifically Intelligent System for Distributed Factory Scheduling”Computer Applications in Production and Engineering, pp. 667-677 (1989).
Interrante et al., “Emergent Agent-Based Scheduling of Manufacturing Systems”.
Juba et al., “Production Improvements Using a Forward Scheduler” (1995).
Li et al., “Minimum Inventory Variability Schedule with Applications in Semiconductor Fabrication,”IEEE Transactions on Semiconductor Manufacturing9:145-149 (1996).
Lin et al., “Integrated Shop Floor Control Using Autonomous Agents,”IIE Transactions24:57-71 (1992).
Lu et al., “Efficient Scheduling Policies to Reduce Mean and Variance of Cycle-Time in Semiconductor Manufacturing Plants,”IEEE Transactions Semiconductor Manufacturing7:374-388 (1994).
Martin-Vega et al., “Applying Just-In-Time in a Wafer Fab: A Case Study,”IEEE Transactions on Semiconductor Manufacturing2:16-22 (1989).
Murthy et al., “Agent Based Cooperative Scheduling,” pp. 112-117 (1997).
Van Parunak et al., “Agents Do It In Time—Experiences with Agent-Based Manufacturing Scheduling” (1999).
Van Parunak et al., “Agents-Based Models & Manufacturing Processes”.
Ramos et al., “Scheduling Manufacturing Tasks Considering Due Dates: A New Method Based on Behaviours and Agendas” (1995).
Shen et al., “An Agent-Based Approach for Dynamic Manufacturing Scheduling” (1988).
Hollister, “Scheduling Paper #17 Summary” (Jun. 23, 1999).
Hollister, “Schedule Paper #19 Summary” (Jun. 23, 1999).
Hollister, “Schedule Paper #23 Summary” (Jun. 23, 1999).
Hollister, “Schedule Paper #32 Summary” (Jun. 23, 1999).
Vaario et al., “An Emergent Modelling Method for Dynamic Scheduling,”Journal of Intelligent Manufacturing9:129-140 (1998).
Wellman et al., “Auction Protocols for Decentralized Scheduling” (May 22, 1998).
Weber, “Material Traceability—The Missing Link in TAP Systems,”Test, Assembly and Packaging Automation and Integration '99 Conference.
“ObjectSpace Fab Solutions Semiconductor Product Development Overview” (presented at SEMICON Southwest 1998).
“Agent Enhanced Manufacturing Systems Initiative (AEMSI) Project” (presented by Dan Radin, ERIM CEC Nov. 12-13, 1998).
Weber, “APC Framework: Raising the Standard for Fab Automation and Integration,”Equipment Automation Conference 1stEuropean Symposium on Semiconductor Manufacturing(Apr. 14, 1999).
Wein, “Scheduling Semiconductor Wafer Fabrication,”IEEE Transactions on Semiconductor Manufacturing1:115-130 (1988).
Bonvik, “Performance Analysis of Manufacturing Systems Under Hybrid Control Policies” (Sep. 22, 1995).
Bonvik, “Performance Analysis of Manufacturing Systems Under Hybrid Control Policies” (Oct. 3, 1995).
Sikora et al., “Coordination Mechanisms for Multi-Agent Manufacturing Systems: Applications to Integrated Manufacturing Scheduling,”IEEE Transactions on Engineering Management44:175-187 (1997).
Sousa et al., “A Dynamic Scheduling Holon for Manufacturing Orders,”Journal of Intelligent Manufacturing9:107-112 (1998).
Upton et al., “Architectures and Auctions in Manufacturing,”Int. J. Computer Integrated Manufacturing4:23-33 (1991).
Fordyce et al., “Logistics Management System (LMS): An Advanced Decision Support System for the Fourth Decision Tier-Dispatch or Short Interval Scheduling,” pp. 1-58 (1994).
Gere, “Heuristics in Job Shop Scheduling,”Management Science13:167-190 (1966).
Ehteshami et al., “Trade-Offs in Cycle Time Management: Hot Lots,”IEEE Transactions on Semiconductor Manufacturing5:101-106 (1992).
Axtell et al., “Distributed Computation of Economic Equilbria via Bilateral Exchange” (Mar. 1997).
International Search Report dated Sep. 30, 2003 (PCT/US02/41777; TT4739-PCT)
U.S. Appl. No. 10/331,715, filed Dec. 30, 2002, Nettles et al.
U.S. Appl. No. 10/331,598,
Barto Larry D.
Li Yiwei
Mata Gustavo
Nettles Steven C.
Parunak H. Van Dyke
Advanced Micro Devices , Inc.
Gandhi Jayprakash N.
Rapp Chad
Williams Morgan & Amerson P.C.
LandOfFree
Determining batch start versus delay does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Determining batch start versus delay, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Determining batch start versus delay will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3569598