Determining a window size for outlier detection

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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C702S189000

Reexamination Certificate

active

07917338

ABSTRACT:
A window size for outlier detection in a time series of a database system is determined. Strength values are calculated for data points using a set of window sizes, resulting at least in one set of strength values for each window size. The strength values increase as a distance between a value of a respective data point and a local mean value increases. For each set of strength values, a weighted sum is calculated based on the respective set of strength values. A weighting function is used to suppress the effect of largest strength values and a window size is selected based on the weighted sums.

REFERENCES:
patent: 6055491 (2000-04-01), Biliris et al.
patent: 6556957 (2003-04-01), Daumer
patent: 2003/0004902 (2003-01-01), Yamanishi et al.
patent: 2005/0137830 (2005-06-01), Moessner et al.
patent: 2005/0137835 (2005-06-01), Moessner
patent: 2005/0160340 (2005-07-01), Abe et al.
patent: 2005/0193281 (2005-09-01), Ide et al.
patent: 2005/0222806 (2005-10-01), Golobrodsky
patent: 2006/0033967 (2006-02-01), Brunner
patent: 2006/0085155 (2006-04-01), Miguelanez et al.
patent: WO99/67758 (2005-06-01), None
Lehr, T. F. , et al. “Fast and Automatic Identification of Performance Outliners in Trace Data”, IBM TDB v38 n2 02-95 p. 409-410, IP.Com IPCOM000114929D, Mar. 30, 2005.
Bahl, LR. et al. “Improved Procedure for Outlier Detection in a Database of Label Sequences Derived from Spoken Utterances”, IBM, TDB v4a 09-92, p. 396-397, IP.Com IPCOM000109636D, Mar. 24, 2005.
Lon-Mu Liu, “Time Series Analysis and Forecasting”, ISBN:0-9765056-6-5, Scientific Computing Associates Corp., chapter 7, Apr. 2006.
Justel, Ana, et al. “Detection of Outlier Patches in Autoregressive Time Series”, Statistica Sinica II (2001) p. 651-673.
Liu, X. et al. “Modelling Multivariate Time Series”, Department of Computer Science, Birkbeck College, University of London, Malet Street, London WC1E 7HX, United Kingdom.

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