Determination of thermal conductances of bonding layers in infra

Details Determination of thermal conductances of bonding layers in infra Determination of thermal conductances of bonding layers in infra

1977-06-23

1978-11-21

Goldstein, Herbert

Measuring and testing

Gas content of a liquid or a solid

By vibration

G01N 2518

Patent

active

041260333

ABSTRACT:
A method for determining in situ the thermal conductances of bonding layers of detectors in infrared detector arrays for quality selection of preferred detector arrays. Each detector of the array is heated successively by laser pulses of variable pulse width and the thermally-induced change in detector resistance is measured as a function of time after each laser pulse and converted directly to its corresponding temperature. Using measured values of detector resistance as a function of temperature for each detector, one can obtain the time-dependence of the detector temperature following each laser pulse for each detector of the array.

REFERENCES:
patent: 2330599 (1943-09-01), Koehni
patent: 3279239 (1966-10-01), Arends et al.
patent: 3434332 (1969-03-01), Maley
patent: 3566669 (1971-03-01), Lawrence et al.
Bartoli et al., "Thermal Recovery Processes in Laser Irradiated HyCdTe(Pc) etectors" in Applied Optics vol. 14 #10 Oct. 75 pp. 2499-2506.

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