Determination of softening temperatures for thin films

Details Determination of softening temperatures for thin films Determination of softening temperatures for thin films

1975-05-01

1976-04-20

Goldstein, Herbert

Measuring and testing

Gas content of a liquid or a solid

By vibration

G01N 2504

Patent

active

039516016

ABSTRACT:
A technique is provided for the determination of the temperature at which thin films of, for instance plastics materials, soften. The thin film under test is disposed upon a conductive substrate and forms the dielectric of a capacitor, one electrode of which is provided by the conductive substrate, and the other electrode of which is provided by an electrically conductive indentor which rests on the surface with a preset loading. The thin film is heated, and its temperature is monitored, the capacitance between the substrate and the indentor is also monitored. When the material of the film softens, the indentor penetrates the film and this produces a sharp increase in the capacitance. By noting the temperature at which this sharp rise in capacitance occurs, an accurate value for the softening temperature of the thin film is obtained.

REFERENCES:
patent: 3187556 (1965-06-01), Ehlers
patent: 3742755 (1973-07-01), Smith

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