Determination of ohmic losses in electrical devices

Details Determination of ohmic losses in electrical devices Determination of ohmic losses in electrical devices

2007-06-08

2009-08-18

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S064000

Reexamination Certificate

active

07577536

ABSTRACT:
The present invention provides a method for determining voltage loss in an electrical device. The method includes the steps of obtaining an array A of voltage values corresponding to at least one current interrupt measurement at current In, wherein Incorresponds to current values I1, I2, . . . , In, wherein subscript n is at least 3; forming an array D of difference values using a difference of the array A over an elapsed time; processing the difference values of the array D to obtain Vn; determining Vnfor each Into form an array V of Vn; and calculating a resistance, R, using the array V, thereby determining voltage loss in the electrical device.

REFERENCES:
patent: 5341004 (1994-08-01), Furuhata
patent: 5396163 (1995-03-01), Nor et al.
patent: 2008/0096075 (2008-04-01), Lundblad et al.

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