Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
1998-09-11
2001-07-17
Bella, Matthew C. (Department: 2621)
Image analysis
Applications
Manufacturing or product inspection
C382S173000, 36, 36, C348S087000
Reexamination Certificate
active
06263098
ABSTRACT:
BACKGROUND OF THE INVENTION
This invention relates to the determination of functionality for integrated circuit (hereinafter IC) modules or boards and more particularly, to an automated method for generating such determinations.
Determinations of functionality for IC modules are very important, such as when patent infringement issues arise or when re-engineering and procurement become necessary due to system upgrades or component obsolescence. Although processes for determining such functionality have been automated to some degree in the prior art, generally speaking they are performed manually from photographs of exposed layers which are etched progressively into the IC modules. Furthermore, no automated process is known in the prior art for generating determinations of functionality for IC modules, with circuit characteristics such as timing expressed therein.
SUMMARY OF THE INVENTION
It is the general object of the present invention to automatically determine the functionality of IC modules.
It is a specific object of the present invention to accomplish the general object with a combination of previously published computer programs.
These and other objects of the present invention are accomplished by imaging sequentially exposed layers which are progressively etched into the IC module. Each layer is individually exposed and a digital signal representing the image displayed thereon, is stored. The stored image signals for all of the layers are then compiled to derive a signal representation of the circuitry disposed within the IC module. This signal representation is processed to define the components in that circuitry and the interconnections extending between those components. These components are then grouped as function blocks which are further grouped until a concise determination of functionality for the IC module is derived.
The scope of the present invention is only limited by the appended claims for which support is predicated on the preferred embodiments set forth hereafter in the following description and the attached drawing.
REFERENCES:
patent: 4732473 (1988-03-01), Bille et al.
patent: 5086477 (1992-02-01), Yu et al.
patent: 5097422 (1992-03-01), Corbin, II et al.
patent: 5598344 (1997-01-01), Dangelo et al.
patent: 5666288 (1997-09-01), Jones et al.
patent: 5818727 (1998-09-01), Sekiguchi
patent: 5878053 (1999-03-01), Koh et al.
Bella Matthew C.
Chawan Sheela
O'Meara John M.
The United States of America as represented by the Secretary of
Zelenka Michael
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