Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate
2011-03-08
2011-03-08
Dunn, Drew A (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
C702S028000, C702S085000, C250S281000, C250S282000, C250S286000, C250S424000
Reexamination Certificate
active
07904253
ABSTRACT:
A method for determining elemental composition of ions from mass spectral data, comprising obtaining at least one mass measurement from mass spectral data; obtaining a search list of candidate elemental compositions whose exact masses fall within a given mass tolerance range from the accurate mass; reporting a probability measure based on a mass error; calculating an isotope pattern for each candidate elemental composition from the search list; constructing a peak component matrix including at least one of the isotope pattern and mass spectral data; performing a regression against at least one of isotope pattern, mass spectral data, and the peak component matrix; reporting a second probability measure for at least one candidate elemental composition based on the isotope pattern regression; and combining the two the probability measures into an overall probability measure. A method for determining elemental isotope ratios from mass spectral data.
REFERENCES:
patent: 6983213 (2006-01-01), Wang
patent: 7348553 (2008-03-01), Wang et al.
patent: 7451052 (2008-11-01), Wang et al.
Gu Ming
Wang Yongdong
Aker David
Cerno Bioscience LLC
Dunn Drew A
Vo Hien X
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