Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Reexamination Certificate
2000-08-01
2002-06-04
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Orientation or position
C702S151000, C702S036000, C356S498000, C356S617000
Reexamination Certificate
active
06401052
ABSTRACT:
FIELD OF THE INVENTION
The present invention relates to a determination method for a position-signal. In particular. two primary detectors scan a material measure that can be moved relative to the primary detectors. The measure material has a plurality of graduations that are arranged equidistant from one another. The primary detectors supply measurement signals corresponding thereto.
The measurements signals are periodic, given uniform relative motion of the material measure. The measurement signals are also sinusoidal, and are phase-displaced relative to one another by 90° . The material measure executing a relative motion of one graduation during one period of the measurement signals.
An updating takes place concerning the graduation to which the determined measurement signals are currently to be allocated.
A rough angle is determined from the measurement signals, on the basis of amplitudes and offsets of the measurement signals.
A position angle is determined inside the graduation to which the determined measurement signals are currently allocated. The position angle is determined on the basis of predetermined rough angle correction values that are specific to the rough angle and that are independent of the graduation.
The position signal is determined from the position angle and from the graduation to which the determined measurement signals are currently allocated.
In addition, the present invention relates to a determination method for the corresponding correction values.
BACKGROUND INFORMATION
Determination methods of this sort are described in, for example, B. Höscheler and L. Szamel, “Innovative technique for easy high-resolution position acquisition with sinusoidal incremental encoders,” PCIM 97 Europe, Intelligent Motion, Conference Proceedings, vol. 31.
This article describes the determination of a position angle, and then therefrom the position signal, from the rough angle on the basis of predetermined rough angle correction values that are specific to the rough angle and that are independent of the graduation. The correction of the offset and amplitude of the measurement signals is mentioned only in passing.
SUMMARY
An object of the present invention is to provide a determination method for a position signal, or a corresponding determination method for correction values for measurement signals.
For the determination method for the position signal, this object is achieved in that in the determination of the rough angle a phase displacement (differing by 90° if necessary) of the measurement signals relative to one another is also taken into account. The amplitudes and offsets of the measurement signals, as well as the phase displacement of the measurement signals relative to one another, are predetermined in a graduation-specific manner.
For the determination method for correction values for measurement signals, the object is achieved in that
the measurement signal correction values also include a fundamental value for a phase displacement of the then-acquired measurement signals relative to one another,
and the measurement signal correction values are determined and stored in a graduation-specific manner.
The graduation-specific intermediate correction values are determined on the basis of the measurement signals acquired for this graduation, and on the basis of the measurement signal correction values determined for this graduation.
The determination method for the position signal operates fairly well when the amplitudes, the offsets and/or the phase displacement within the graduation to which the determined measurement signals are currently allocated are independent of the measurement signals.
However, it works even better if a preliminary angle is determined on the basis of the measurement signals, and the amplitudes, the offsets, and/or the phase displacement within the graduation to which the determined measurement signals are currently allocated are dependent on the preliminary angle.
Corresponding to this, in the determination method for the correction values, the measurement signal correction values also include modification values for the amplitudes, the offsets, and/or the phase displacement of the then-acquired measurement signals, so that the amplitudes, the offsets, and/or the phase displacement within the graduation to which the then-acquired measurement signals are allocated depend on a preliminary angle, which is determined on the basis of the then-acquired measurement signals.
Since the correction values change only slightly from graduation to graduation, it is sufficient if the amplitudes, the offsets, and/or the phase displacement depend on the preliminary angle in linear fashion.
In this way, the fundamental values and modification values define linear functions section-by-section. The fundamental values and the modification values of adjacent graduations are determined in such a way that a continuous transition for the amplitudes, the offsets, and/or the phase displacement results between the adjacent graduations.
The determination method for the correction values works particularly well if the material measure moves only slowly during the scanning.
Particularly good measurement signal correction values result if, per graduation, the measurement signals acquired for this graduation are essentially uniformly distributed in the period allocated to this graduation.
Optionally, the determination method for the correction values can be executed before the determination of position signals, or else can be executed in the background during the determination of the position signals, parallel thereto. In the latter case, the incremental detector evaluation system constantly updates itself automatically. Optimized correction values are thus available for later measurements.
REFERENCES:
patent: 4229647 (1980-10-01), Burkhardt
patent: 4573000 (1986-02-01), Nelle
patent: 4776698 (1988-10-01), Crosdale
patent: 5285144 (1994-02-01), Hsu et al.
patent: 5438330 (1995-08-01), Yamazaki et al.
B. Höscheler and L. Szamel, “Innovative technique for easy high-resolution position acquisition with sinusoidal incremental encoders,” PCIM 97 Europe, Intelligent Motion, Conference Porceedings, vol. 31, pp. 407-416.
Herb Robert
Hoescheler Bernhard
Papiernik Wolfgang
Bui Bryan
Kenyon & Kenyon
Siemens Aktiengesellschaft
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