Deterioration estimating method for a light emitting device and

Details Deterioration estimating method for a light emitting device and Deterioration estimating method for a light emitting device and

1996-04-03

1997-04-29

Edun, Muhammad N.

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Radiation beam modification of or by storage medium

369121, 369 54, 372 33, 372 34, G01B 7125

Patent

active

056256167

ABSTRACT:
A current detector detects a driving current Im flowing through a light emitting device (laser diode); a temperature sensor is arranged in the vicinity of the light emitting device; a microcomputer is supplied with the outputs of the current detector and temperature sensor; a temperature correction coefficient specific to the light emitting device, obtained based on a driving current value IT1 at a temperature T1 and a driving current value IT2 at a temperature T2 (>T1), is stored in memory; a deterioration threshold current Id for a detected temperature Ti is calculated; and when the deterioration threshold current Id for the detected temperature Ti is exceeded by the detected current, a driver is controlled so as to inhibit the supply of the driving current to the light emitting device. Since the operating temperature also is taken into consideration, deterioration of the light emitting device can be accurately estimated, thereby preventing erroneous recording/reproduction of data.

REFERENCES:
patent: 5436880 (1995-07-01), Eastman et al.

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