Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1983-05-19
1986-03-11
Kittle, John E.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01N 2100
Patent
active
045752443
ABSTRACT:
The invention relates to a detector system for measuring the intensity of a radiation scattered at a predetermined angle from a sample (10) irradiated at a specified angle of incidence. The detector system comprises a path to transmit an incident beam of radiation onto the sample (10) and at least one radiation sensor (15,16,17,18; 35,36, . . . ; 45) positioned in the path of the radiations scattered from the sample (10). According to the invention the detector system has a dome positioned in the path of the radiation scattered from the sample (10). The dome is provided with at least one concave reflecting surface (11,12,13,14; 31,32, . . . ; 41) located in a range corresponding to the predetermined scattering angle, and the or each concave reflecting surface forms the image of the sample (10) onto a radiation sensor (15,16,17,18; 35,36, . . . ; 45). For example a 0.degree./45.degree. detector system is preferably arranged so that in the middle of the dome an opening (19) is provided suitable to let the incident beam of radiation fall onto the sample (10), and the dome is provided with at least two concave reflecting surfaces (11,12,13,14; 31,32, . . . ) located symmetrically with respect to the sample (10). A 45.degree./0.degree. detector system can be accomplished so that the dome is a member (44) provided with a rotationally symmetrical concave reflecting surface (41) positioned opposite the sample (10), radiation sensor (45) is disposed at the tip of said concave reflecting surface (41), and in the path of the incident beam there are an outside reflecting surface of revolution (42) of that member (44) as well as a further reflecting surface of revolution (43), the latter reflecting the beam of radiation coming from said outside reflecting surface (42) onto the sample (10) at the specified angle of incidence (FIG. 1).
REFERENCES:
patent: 3431423 (1969-03-01), Keller
patent: 3600581 (1971-09-01), Menke
patent: 4360275 (1982-11-01), Louderback
"Reliable Cooling: A Major Problem is Being Solved by the IR Industry", Missiles & Rockets, 11/9/59, pp. 20-24, La Fond.
Journal Sci. Instrum. 1965, vol. 42, pp. 385-389, "An Infra-Red Reflectometer with a Spheroidal Mirror", by W. R. Blevin and W. J. Brown.
Journal Opt. Soc. Am. 1952, vol. 42, No. 4, pp. 263-265, "A Reflectometer for Measuring Diffuse Reflectance in the Visible and Infrared Regions" by W. J. Derksen & T. I. Monahan.
Czabaffy Andras
Horvath Lorand
Kaffka Karoly
Nadai Bela
Kittle John E.
Kozponti Elelmiszeripari Kutato Intezet
Saitta Thomas
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