Geometrical instruments – Gauge – Coordinate movable probe or machine
Reexamination Certificate
2007-04-03
2007-04-03
Gutierrez, Diego (Department: 2859)
Geometrical instruments
Gauge
Coordinate movable probe or machine
C033S556000, C033S559000
Reexamination Certificate
active
11110953
ABSTRACT:
A detector supporting mechanism comprising a first arm having its one end fixed on a mount linearly movable relative to a workpiece, the first arm having a rotation axis at the other end and a second arm provided on the first arm so as to be turnable on the rotation axis relative to the first arm, a detector being mounted on a tip of the second arm, wherein the rotation axis is provided on a plane inclined at an angle of 45° from the movement axis of the mount while being inclined at an angle of 45° from the movement axis of the mount in a projection on a plane which is inclined at an angle of 45° from the plane inclined at an angle of 45° from the movement axis of the mount, and which contains the movement axis of the mount, and wherein an axis of the detector mounted on the second arm intersects the rotation axis.
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Patent Abstracts of Japan, vol. 1995, No. 01, Feb. 28, 1995, & JP 06 300505 A (Kosaka Kenkyusho KK), Oct. 28, 1994, English Abstract.
Cohen Amy R.
Gutierrez Diego
Safran David S.
Tokyo Seimitsu Co. Ltd.
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