Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1994-11-23
1996-11-05
Pham, Hoa Q.
Optics: measuring and testing
By particle light scattering
With photocell detection
356381, G01N 2100
Patent
active
055723217
ABSTRACT:
The present invention relates to a device for measuring the luminous intensity scattered by thin films of colloidal media. It is more particularly intended for submicron grain-size analysis by photon correlation, and comprises a device for measuring the luminous intensity scattered by thin films (16) of colloidal media. The invention includes a monochromatic luminous source (2); a converging optical system (4) focusing the source on the thin film to be analyzed; at least one photosensitive detector (5; 5'; 5"; 5'") detecting the light scattered or backscattered by the thin film; and a system (60, 70) for processing the signal coming from photodetector(s) (5).
REFERENCES:
patent: 3621243 (1971-11-01), Olivier
patent: 4940326 (1990-07-01), Tatsuno
patent: 4966457 (1990-10-01), Hayano et al.
patent: 5198369 (1993-03-01), Itoh et al.
Frot Didier
Patin Patrick
Pinier Frank
Woodley Bill
Institut Francais du Pe'trole
Pham Hoa Q.
Sematech
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