Detection with evanescent wave probe

Electricity: measuring and testing – Particle precession resonance – Using optical pumping or sensing device

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S300000

Reexamination Certificate

active

11542775

ABSTRACT:
Methods and systems for spatially resolved spin resonance detection in a sample of material are disclosed. Also disclosed are methods and systems for spatially resolved impedance measurements in a sample of material. The disclosed methods and samples can be used in screening of plurality of biological, chemical and material samples.

REFERENCES:
patent: 5821410 (1998-10-01), Xiang et al.
patent: 5936237 (1999-08-01), van der Weide
patent: 6097188 (2000-08-01), Sweedler et al.
patent: 6173604 (2001-01-01), Xiang et al.
patent: 6182499 (2001-02-01), McFarland et al.
patent: 6311086 (2001-10-01), Ardenkjaer-Larsen et al.
patent: 6346290 (2002-02-01), Schultz et al.
patent: 6401519 (2002-06-01), McFarland et al.
patent: 6410331 (2002-06-01), Schultz et al.
patent: 6420179 (2002-07-01), Schultz et al.
patent: 6463186 (2002-10-01), Li
patent: 6472869 (2002-10-01), Upschulte et al.
patent: 6532806 (2003-03-01), Xiang et al.
patent: 6538454 (2003-03-01), Frenkel et al.
patent: 6597185 (2003-07-01), Talanov et al.
patent: 6614227 (2003-09-01), Ookubo
patent: 6641940 (2003-11-01), Li et al.
patent: 6649413 (2003-11-01), Schultz et al.
patent: 6680617 (2004-01-01), Moreland et al.
patent: 6686205 (2004-02-01), Schultz et al.
patent: 6693426 (2004-02-01), Xiang et al.
patent: 6794052 (2004-09-01), Schultz et al.
patent: 6822454 (2004-11-01), Peck et al.
patent: 6825645 (2004-11-01), Kelly et al.
patent: 6864201 (2005-03-01), Schultz et al.
patent: 6924150 (2005-08-01), Xiang et al.
patent: 6946835 (2005-09-01), Xiang et al.
patent: 6957565 (2005-10-01), Matsiev et al.
patent: 7034091 (2006-04-01), Schultz et al.
patent: 7073370 (2006-07-01), Matsiev et al.
patent: 7148683 (2006-12-01), Xiang et al.
patent: 2001/0055669 (2001-12-01), Schultz et al.
patent: 2002/0175693 (2002-11-01), Starr et al.
patent: 2002/0197645 (2002-12-01), Martin
patent: 2003/0162179 (2003-08-01), Potyrailo et al.
patent: 2004/0014077 (2004-01-01), Schultz et al.
Lacey et al., “High Resolution NMR Spectroscopy of Sample Volumes from 1 NL to 10 μL,”Chemical Reviews, Feb. 24, 1999, pp. A-T.
Soohoo, “A Microwave Magnetic Microscope,”Journal of Applied Physics, Suppl. to vol. 33, No. 3, Mar. 1962, pp. 1276-1277.
Binnig et al., “Atomic Force Microscope,”Phys. Rev. Lett., 56(9), Mar. 3, 1986, pp. 930-933.
Glover et al., “Limits to magnetic Resonance Microscopy,”Rep. Prog. Phys.65 (2002), pp. 1489-1511.
Sarid et al., “Improved Atomic Force Microscope Using a Laser Diode Interferometer,”Rev. Sci. Instrum.63(8), Aug. 1992, pp. 3905-3908.
Zhong et al., “Fractured Polymer/Silica Fiber Surface Studied by Tapping Mode Atomic Force Microscopy,”Surface Science Letters, 290 (1993), pp. L688-L692.
Takata, “Whole Electronic Cantilever Control for Atomic Force Microscopy,”Rev. Sci. Instrum.64(9), Sep. 1993, pp. 2598-2600.
Van Der Werf, et al., “Compact Stand-Alone Atomic Force Microscope,”Rev. Sci. Instrum.64(10), Oct. 1993, pp. 2892-2897.
Grober et al., “Design and Implementation of a Low Temperature Near-Field Scanning Optical Microscope,”Rev. Sci. Instrum.65(3), Mar. 1994, pp. 626-631.
Leong et al., “Shear Force Microscopy With Capacitance Detection for Near-Field Scanning Optical Microscopy,”Appl. Phys. Lett.66(11), Mar. 13, 1995, pp. 1432-1434.
Karrai et al., “Piezoelectric Tip-Sample Distance Control for Near Field Optical Microscopes,”Appl. Phys. Lett.65(14), Apr. 3, 1994, pp. 1842-1844.
Tarrach et al., “Design and Construction of a Versatile Scanning Near-Field Optical Microscope for Fluoresence Imaging of Single Molecules,”Rev. Sci. Instrum.66(6), Jun. 1995, pp. 3569-3575.
Brunner et al., “Distance Control in Near-Field Optical Cicroscopy With Piezoelectrical Shear Force Detection Suitable for Imaging in Liquids,”Rev. Sci. Instrum., 68(4), Apr. 1997, pp. 1769-1772.
Gao et al., “Quantative Microwave Near-Field Microscopy of Dielectric Properties,” Rev. Sci. Instrum., 69(11), Nov. 1998, pp. 3846-3851.
Cho et al., “Scanning Nonlinear Dielctric Microscopy With Contact Sensing Mechanism for Observation on Nanometer Sized Ferorelectric Domains,”Jpn. J. Appl. Phys., vol. 38 (1999), pp. 5689-5694.
Giessibl, “Atomic Resolution of Si(111)-(7×7) by Noncontact Atomic Force Miscroscopy With a Force Sensor Based on a Quartz Tuning Fork,”Appl. Phys. Lett.76(11), Mar. 13, 2000, pp. 1470-1472.
Oral et al., “High-Sensitivity Noncontact Atomic Force Miscroscope/Scanning Tunneling (nc AFM/STM) operating at subangstrom Oscillation Amplitudes for Atomic Resolution Imaging and Force Spectroscopy,” Rev Sci. Instum. 74(8), Aug. 2003, pp. 3656-3663.
Hauser et al., “Magnetoresistors,”Magnet Sensors and Magnetometers, Chapter 4, Ed. Pavel Ripka, Artech House, 2001, pp. 129-171.
Popvic et al., “Hall Effect Magnetic Sensors,”Magnet Sensors and Magnetometers, Chapter 5, Ed. Pavel Ripka, Artech House, 2001, pp. 173-242.
Witte et al., “X-Band Elektronenspinresonanz mit Blochscher Meβanordnung,”Appl. Phys., vol. 2, No. 2, Aug. 1973, pp. 63-70 9English Abstract included).
Wallace et al., “Microstrip Resonators for Electron-Spin Resonance,”Rev. Sci. Instrum., vol. 62, No. 7, Jul. 1991, pp. 1754-1766.
Furusawa, et al., “Distribution of Nitrogen and Nickel in a Synthetic Diamond Crystal Observed With Scanning ESR Imaging,”J. Phys. Soc. Jpn., vol. 59, No. 7, Jul. 1990, pp. 2340-2343.
Brossel et al., “Gréation Optique D'Une Inégalité de Population Entre Les Sous-Niveaux Zeeman de L'état Fondamental des Atomes,”J. Phys. Radium, vol. 13, No. 12, Dec. 1952, pp. 668-669.
Kastler et al., “Quelques Sugestions Concernmant la Production Optique et al. Detection Optique D'Une Inegalite de Population des Niveaux de Quantification Spatiale des Atomes Application a L'Experience de Stern et Gerlach et a la Resonance Magnetique,”J. Phys. Radium, vol. 11, No. 6, Jun. 1950, pp. 255-265.
Rafferty, “High-Field NMR of Adsorbed Xenon Polarized by Laser Pumping,”Phys. Rev. Lett., vol. 66, No. 5, Feb. 4, 1991, pp. 584-587.
Kohler et al., “Single Molecule Electron Paramagnetic Resonance Spectroscopy: Hyperfine Splitting Owing to a Single Nucleus,”Science, vol. 268, Jun. 9, 1995, pp. 1457-1460.
Wrachtrup et al., “Optical Detection of Magnetic Resonance in a Single Molecule,”Nature, vol. 363, No. 6426, May 20, 1993, pp. 244-245.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Detection with evanescent wave probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Detection with evanescent wave probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Detection with evanescent wave probe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3841572

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.