Detection with evanescent wave probe

Details Detection with evanescent wave probe Detection with evanescent wave probe

2007-09-11

2007-09-11

Shrivastav, Brij. B. (Department: 2859)

Electricity: measuring and testing

Particle precession resonance

C324S304000

Reexamination Certificate

active

11542830

ABSTRACT:
Methods and systems for spatially resolved spin resonance detection in a sample of material are disclosed. Also disclosed are methods and systems for spatially resolved impedance measurements in a sample of material. The disclosed methods and samples can be used in screening of plurality of biological, chemical and material samples.

REFERENCES:
patent: 5821410 (1998-10-01), Xiang et al.
patent: 5936237 (1999-08-01), van der Weide
patent: 6097188 (2000-08-01), Sweedler et al.
patent: 6173604 (2001-01-01), Xiang et al.
patent: 6182499 (2001-02-01), McFarland et al.
patent: 6311086 (2001-10-01), Ardenkjaer-Larsen et al.
patent: 6346290 (2002-02-01), Schultz et al.
patent: 6401519 (2002-06-01), McFarland et al.
patent: 6410331 (2002-06-01), Schultz et al.
patent: 6420179 (2002-07-01), Schultz et al.
patent: 6463186 (2002-10-01), Li
patent: 6472869 (2002-10-01), Upschulte et al.
patent: 6532806 (2003-03-01), Xiang et al.
patent: 6538454 (2003-03-01), Frenkel et al.
patent: 6597185 (2003-07-01), Talanov et al.
patent: 6614227 (2003-09-01), Ookubo
patent: 6641940 (2003-11-01), Li et al.
patent: 6649413 (2003-11-01), Schultz et al.
patent: 6680617 (2004-01-01), Moreland et al.
patent: 6686205 (2004-02-01), Schultz et al.
patent: 6693426 (2004-02-01), Xiang et al.
patent: 6794052 (2004-09-01), Schultz et al.
patent: 6822454 (2004-11-01), Peck et al.
patent: 6825645 (2004-11-01), Kelly et al.
patent: 6864201 (2005-03-01), Schultz et al.
patent: 6924150 (2005-08-01), Xiang et al.
patent: 6946835 (2005-09-01), Xiang et al.
patent: 6957565 (2005-10-01), Matsiev et al.
patent: 7034091 (2006-04-01), Schultz et al.
patent: 7073370 (2006-07-01), Matsiev et al.
patent: 7148683 (2006-12-01), Xiang et al.
patent: 2001/0055669 (2001-12-01), Schultz et al.
patent: 2002/0175693 (2002-11-01), Starr et al.
patent: 2002/0197645 (2002-12-01), Martin
patent: 2003/0162179 (2003-08-01), Patyrailo et al.
patent: 2004/0014077 (2004-01-01), Schultz et al.
Lacey et al., “High Resolution NMR Spectroscopy of Sample Volumes from 1 NL to 10 μL,”Chemical Reviews, Feb. 24, 1999, pp. A-T.
Soohoo, “A Microwave Magnetic Microscope,”Journal of Applied Physics, Suppl. to vol. 33, No. 3, Mar. 1962, pp. 1276-1277.
Binnig et al., “Atomic Force Microscope,”Phys. Rev. Lett., 56(9), Mar. 3, 1986, pp. 930-933.
Glover et al., “Limits to magnetic Resonance Microscopy,”Rep. Prog. Phys.65 (2002), pp. 1489-1511.
Sarid et al., “Improved Atomic Force Microscope Using a Laser Diode Interferometer,”Rev. Sci. Instrum.63(8), Aug. 1992, pp. 3905-3908.
Zhong et al., “Fractured Polymer/Silica Fiber Surface Studied by Tapping Mode Atomic Force Microscopy,”Surface Science Letters, 290 (1993), pp. L688-L692.
Takata, “Whole Electronic Cantilever Control for Atomic Force Microscopy,”Rev. Sci. Instrum.64(9), Sep. 1993, pp. 2598-2600.
Van Der Werf et al., “Compact Stand-Alone Atomic Force Microscope,”Rev. Sci. Instrum.64(10), Oct. 1993, pp. 2892-2897.
Grober et al., “Design and Implementation of a Low Temperature Near-Field Scanning Optical Microscope, ”Rev. Sci. Instrum.65(3), Mar. 1995, pp. 626-631.
Leong et al., “Shear Force Microscopy With Capacitance Detection for Near-Field Scanning Optical Microscopy,”Appl. Phys. Lett.66(11), Mar. 13, 1995, pp. 1432-1434.
Karrai et al., “Piezoelectric Tip-Sample Distance Control for Near Field Optical Microscopes,”Appl. Phys. Lett.66(14), Apr. 3, 1994, pp. 1842-1844.
Tarrach et al., “Design and Construction of a Versatile Scanning Near-Field Optical Microscope for Fluorescence Imaging of Single Molecules,”Rev. Sci. Instrum., 66(6), Jun. 1995, pp. 3569-3575.
Brunner et al., “Distance Control in Near-Field Optical Cicroscopy With Piezoelectrical Shear Force Detection Suitable for Imaging in Liquids,”Rev. Sci. Instrum., 68(4), Apr. 1997, pp. 1769-1772.
Gao et al., “Quantative Microwave Near-Field Microscopy of Dielectric Properties,” Rev. Sci. Instrum., 69(11), Nov. 1998, pp. 3846-3851.
Cho et al., “Scanning Nonlinear Dielctric Microscopy With Contact Sensing Mechanism for Observation on Nanometer Sized Ferorelectric Domains,”Jpn. J. Appl. Phys., vol. 38 (1999), pp. 5689-5694.
Giessibl, “Atomic Resolution of Si(111)-(7×7) by Noncontact Atomic Force Miscroscopy With a Force Sensor Based on a Quartz Tuning Fork,”Appl. Phys. Lett.76(11), Mar. 13, 2000, pp. 1470-1472.
Orai et al., “High-Sensitivity Noncontact Atomic Force Miscroscope/Scanning Tunneling (nc AFM/STM) operating at subangstrom Oscillation Amplitudes for Atomic Resolution Imaging and Force Spectroscopy,” Rev Sci. Instum. 74(8), Aug. 2003, pp. 3656-3663.
Hauser et al., “Magnetoresistors,”Magnet Sensors and Magnetometers, Chapter 4, Ed. Pavel Ripka, Artech House, 2001, pp. 129-171.
Popvic et al., “Hall Effect Magnetic Sensors,”Magnet Sensors and Magnetometers, Chapter 5, Ed. Pavel Ripka, Artech House, 2001, pp. 173-242.
Witte et al., “X-Band Elektronenspinresonanz mit Blochscher Meβanordnung,”Appl. Phys., vol. 2 No. 2, Aug. 1973, pp. 63-70 9English Abstract included).
Wallace et al., “Microstrip Resonators for Electron-Spin Resonance,”Rev. Sci. Instrum., vol. 62, No. 7, Jul. 1991, pp. 1754-1766.
Furusawa et al., “Distribution of Nitrogen and Nickel in a Synthetic Diamond Crystal Observed With Scanning ESR Imaging,”J. Phys. Soc. Jpn., vol. 59, No. 7, Jul. 1990, pp. 2340-2343.
Brossel et al., “Gréation Optique D'Une Inégalité de Population Entre Les Sous-Niveaux Zeeman de L'état Fondamental des Atomes,”J. Phys. Radium, vol. 13, No. 12, Dec. 1952, pp. 668-669.
Kastler et al., “Quelques Suggestions Concernmant la Production Optique et al. Detection Optique D'Une Inegalite de Population des Niveaux de Quantification Spatiale des Atomes Application a L'Experience de Stern et Gerlach et a la Resonance Magnetique,”J. Phys. Radium, vol. 11, No. 6, Jun. 1950, pp. 255-265.
Rafferty, “High-Field NMR of Adsorbed Xenon Polarized by Laser Pumping,”Phys. Rev. Lett., vol. 66, No. 5, Feb. 4, 1991, pp. 584-587.
Kohler et al., “Single Molecule Electron Paramagnetic Resonance Spectroscopy: Hyperfine Splitting Owing to a Single Nucleus,”Science, vol. 268, Jun. 9, 1995, pp. 1457-1460.
Wrachtrup et al., “Optical Detection of Magnetic Resonance in a Single Molecule,”Nature, vol. 363, No. 6426, May 20, 1993, pp. 244-245.

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