Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1990-09-05
1991-09-17
Scott, Jr., Leon
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
356400, 356237, 356394, G01B 1100
Patent
active
050489674
ABSTRACT:
A detection optical system for detecting a pattern on the surface of an object includes an illumination device for illuminating the surface of the object with a light beam, a scanning system cooperable with the illumination device to scan the surface of the object with the light beam, and an optical arrangement for receiving light from each point on the surface of the object scanningly illuminated with the light beam by the cooperation of the illumination device and the scanning system. The optical arrangement is effective to form an image of a light spot, formed by the light beam upon the surface of the object. The optical arrangement includes a stop member disposed at a position whereat the image of the light spot is formed. The stop member has an aperture of a size substantially the same as, or not greater than, that of the image of the light spot, wherein the pattern on the surface of the object is detected on the basis of light passed through the stop member.
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Ina Hideki
Suzuki Akiyoshi
Canon Kabushiki Kaisha
Jr. Leon Scott
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