Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-08-09
2011-08-09
Bui, Bryan (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C326S038000
Reexamination Certificate
active
07996162
ABSTRACT:
The rates of change and difference between signals sensed at adjacent electronic module output ports are determined and compared to criteria to determine whether the output ports are shorted.
REFERENCES:
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patent: 6940299 (2005-09-01), Lim et al.
patent: 7049842 (2006-05-01), Lopezdenava
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patent: 7106097 (2006-09-01), Whetsel
patent: 2005/0134301 (2005-06-01), Lopezdenava
patent: 2009/0277244 (2009-11-01), Doll et al.
Spieker Arnold H.
Zhang Wendy
Bui Bryan
Kelsey-Hayes Company
MacMillan Sobanski & Todd LLC
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