Detection of possible failure of capacitive elements in an...

Surgery: light – thermal – and electrical application – Light – thermal – and electrical application – Electrical therapeutic systems

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07089057

ABSTRACT:
Apparatus and method for monitoring capacitive elements of an implantable medical device system for device failure and responding thereto. A therapy measurement block monitors a charge value across one or more capacitive elements. If the charge value falls outside a prescribed range, indicating possible failure in the capacitive element, the system removes from service the capacitive element and its associated regulator, notifies the implantable neuro stimulator of the failure and/or takes appropriate corrective measures.

REFERENCES:
patent: 4232679 (1980-11-01), Schulman
patent: 4542532 (1985-09-01), McQuilkin
patent: 4949720 (1990-08-01), Thompson
patent: 5107833 (1992-04-01), Barsness
patent: 5117825 (1992-06-01), Grevious
patent: 5127404 (1992-07-01), Wyborny et al.
patent: 5137021 (1992-08-01), Wayne et al.
patent: 5146412 (1992-09-01), Jones
patent: 5154172 (1992-10-01), Terry, Jr. et al.
patent: 5168871 (1992-12-01), Grevious
patent: 5179950 (1993-01-01), Stanislaw
patent: 5201865 (1993-04-01), Kuehn
patent: 5222494 (1993-06-01), Baker, Jr.
patent: 5324315 (1994-06-01), Grevious
patent: 5350411 (1994-09-01), Ryan et al.
patent: 5354320 (1994-10-01), Schaldach et al.
patent: 5384544 (1995-01-01), Flugstad et al.
patent: 5402794 (1995-04-01), Wahlstrand et al.
patent: 5431684 (1995-07-01), Archer et al.
patent: 5443486 (1995-08-01), Hrdlicka et al.
patent: 5501703 (1996-03-01), Holsheimer et al.
patent: 5579234 (1996-11-01), Wiley et al.
patent: 5591211 (1997-01-01), Meltzer
patent: 5628768 (1997-05-01), Lubbe
patent: 5630835 (1997-05-01), Brownlee
patent: 5643330 (1997-07-01), Holsheimer et al.
patent: D382345 (1997-08-01), Minogue
patent: 5766232 (1998-06-01), Grevious et al.
patent: 5800465 (1998-09-01), Thompson et al.
patent: D400262 (1998-10-01), Hirakawa et al.
patent: 5836983 (1998-11-01), Weijand et al.
patent: 5861019 (1999-01-01), Sun et al.
patent: 5873893 (1999-02-01), Sullivan et al.
patent: 5895416 (1999-04-01), Barreras, Sr. et al.
patent: 5908443 (1999-06-01), Brewer et al.
patent: 5925068 (1999-07-01), Kroll
patent: 5925070 (1999-07-01), King et al.
patent: 5938690 (1999-08-01), Law et al.
patent: 5941906 (1999-08-01), Barreras, Sr. et al.
patent: 5948004 (1999-09-01), Weijand et al.
patent: 5948007 (1999-09-01), Starkebaum et al.
patent: 6073085 (2000-06-01), Wiley et al.
patent: 6185458 (2001-02-01), Ochs et al.
patent: 6304781 (2001-10-01), Busch et al.
patent: 2003/0204221 (2003-10-01), Rodriquez et al.
patent: 2003/0204222 (2003-10-01), Leinder et al.
patent: 2003/0204223 (2003-10-01), Leinders et al.
patent: 2003/0204224 (2003-10-01), Torgerson et al.
patent: 2003/0204226 (2003-10-01), Acosta et al.
patent: 2003/0208244 (2003-11-01), Stein et al.
patent: 0360551 (1990-03-01), None
patent: 0480569 (1992-04-01), None
patent: 0589610 (1994-03-01), None
patent: 0671687 (1995-09-01), None
patent: 0811395 (1997-12-01), None
patent: 0946956 (2002-02-01), None
patent: 0753327 (2003-12-01), None
patent: 0966311 (2004-01-01), None
patent: 0913166 (2004-09-01), None
Medtronic Neurostimulation Systems,Expanding the Array of Pain Control Solutions, Medtronic, 2002.
Mattrix Neurostimulation System,The One Way to Get Two Stimulation Models, Medtronic, 1995.
International Search Report, Application No. PCT/US2003/12143, mailed Feb. 9, 2004.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Detection of possible failure of capacitive elements in an... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Detection of possible failure of capacitive elements in an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Detection of possible failure of capacitive elements in an... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3693264

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.