Detection of pattern-sensitive faults in RAM by use of M-sequenc

Details Detection of pattern-sensitive faults in RAM by use of M-sequenc Detection of pattern-sensitive faults in RAM by use of M-sequenc

1990-03-08

1993-06-22

Beausoliel, Robert W.

Excavating

371 221, 371 212, 371 27, G11C 2900

Patent

active

052220672

ABSTRACT:
The detection method for Pattern Sensitive Faults by use of M-sequencies includes the steps of clearing the entire memory arrays, reading the memory arrays, and checking if the memory cells are cleared, filling the properly selected group with two or three kinds of M-sequencies whose phases are different from each other, reading and checking the memory of the neighboring cells for the correct content, and repeating the above steps by shifting the element of each M-sequence and by changing the position of the above groups of memory cells.

REFERENCES:
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patent: 4730318 (1988-03-01), Bogholtz, Jr. et al.
patent: 4757503 (1988-07-01), Hayes et al.
patent: 4852096 (1989-07-01), Brinkman
patent: 4873705 (1989-10-01), Johnson
patent: 4885748 (1989-12-01), Hoffmann et al.

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