Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1975-05-27
1977-03-29
Smith, Alfred E.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
250563, G01N 2116, G01N 2132
Patent
active
040146154
ABSTRACT:
A circuit arrangement for use with a scanned-beam moving-surface blemish detector uses the detection of leading-and trailing-edges of the surface in each scan to provide in the following scan a margin or margins, the separation of which provides a measure of the surface width over which detection can take place without the edges being detected as faults. In a modification the margins are extended to the direction of surface movement by introducing a minimum width, between leading-and trailing-edge margins, which must exist before fault detection is permitted.
REFERENCES:
patent: 3061731 (1962-10-01), Thier et al.
patent: 3584963 (1971-06-01), Wisner
patent: 3646353 (1972-02-01), Bhullar et al.
patent: 3825765 (1974-07-01), Schober et al.
Ferranti Limited
Grigsby T. N.
Smith Alfred E.
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