Detection of charge deficient spot susceptibility

Details Detection of charge deficient spot susceptibility Detection of charge deficient spot susceptibility

1996-01-11

1997-12-30

Karlsen, Ernest F.

Electricity: measuring and testing

A material property using electrostatic phenomenon

For flaw detection

324501, 324554, 324 72, 355203, G03G 2100

Patent

active

057034877

ABSTRACT:
A process is disclosed for ascertaining the microdefect levels of an electrophotographic imaging member comprising the steps of measuring either the differential increase in charge over and above the capacitive value or measuring reduction in voltage below the capacitive value of a known imaging member and of a virgin imaging member and comparing differential increase in charge over and above the capacitive value or the reduction in voltage below the capacitive value of the known imaging member and of the virgin imaging member.

REFERENCES:
patent: 3898001 (1975-08-01), Hardenbrook
patent: 4134137 (1979-01-01), Jacobs
patent: 5132627 (1992-07-01), Popovic et al.
patent: 5175503 (1992-12-01), Mishra et al.
patent: 5594349 (1997-01-01), Kimura

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