Detection of a pattern in a digital image

Image analysis – Pattern recognition – Template matching

Reexamination Certificate

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C382S218000

Reexamination Certificate

active

07116824

ABSTRACT:
A method for detecting a pattern in a digital image by successive comparison of the content of current windows with the content of at least one reference window representative of the pattern, the reference window containing values of variance or standard deviation of sub-blocks of pixels of the pattern and the current windows containing values of variance or standard deviation of sub-blocks of pixels of the image, the sub-blocks being of the same size in the current and reference windows.

REFERENCES:
patent: 5561475 (1996-10-01), Jung
patent: 5613015 (1997-03-01), Suzuki et al.
patent: 5805727 (1998-09-01), Nakano
patent: 6049363 (2000-04-01), Courtney et al.
patent: 6088483 (2000-07-01), Nakano et al.
patent: 6477275 (2002-11-01), Melikian et al.
patent: 6584224 (2003-06-01), Sun et al.
patent: 6658148 (2003-12-01), Fung et al.
French Search Report from French Patent Application No. 01/13676, filed Oct. 23, 2001.
Patent Abstracts of Japan, vol. 2002, No. 02, Apr. 2, 2002 & JP 2001 297325 A (Mitsubishi Electric Corp.).
Patent Abstracts of Japan, vol. 1999, No. 08, Jun. 30, 1999 & JP 11 085989 A (Canon Inc.).

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