Measuring and testing – Speed – velocity – or acceleration – Angular rate using gyroscopic or coriolis effect
Reexamination Certificate
2007-11-08
2010-12-07
Kwok, Helen C. (Department: 2856)
Measuring and testing
Speed, velocity, or acceleration
Angular rate using gyroscopic or coriolis effect
C073S504160
Reexamination Certificate
active
07845227
ABSTRACT:
A detection device includes a detection circuit. The detection circuit includes an amplifier circuit, a synchronous detection circuit, and a filter section. The amplifier circuit includes a first-type operational amplifier, and the filter section includes a second-type operational amplifier. When a channel width and a channel length of a differential-stage transistor of a differential section of the first-type operational amplifier are respectively referred to as W1aand L1a, a bias current flowing through the differential section is referred to as Ia, a channel width and a channel length of a differential-stage transistor of a differential section of the second-type operational amplifier are respectively referred to as W1band L1b, and a bias current flowing through the differential section is referred to as Ib, W1b×L1b>W1a×L1aand Ia>Ib are satisfied.
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Pending U.S. Patent Application; Fukuzawa, Akihiro; Filed Nov. 8, 2007.
U.S. Appl. No. 11/803,167, filed May 11, 2007.
Kwok Helen C.
Oliff & Berridg,e PLC
Seiko Epson Corporation
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