Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1992-05-18
1994-06-28
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324684, 73517B, 328162, G01P 1508
Patent
active
053250656
ABSTRACT:
A detection circuit for sensing small capacitive changes has been provided. The detection circuit includes a dummy integrator stage that compensates for a voltage step that results from charge injection due to an existing switch in a first integrator stage. As a result, the detection circuit is insensitive to switch injection and amplifier offset voltages.
REFERENCES:
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patent: 4364028 (1982-12-01), Masuda et al.
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patent: 4656871 (1987-04-01), Czarnocri
patent: 5028876 (1991-07-01), Caldwell
patent: 5095750 (1992-03-01), Suzuki et al.
Bennett Paul T.
Mietus David F.
Bingham Michael D.
Botsch Sr. Bradley J.
Motorola Inc.
Tobin Christopher M.
Wieder Kenneth A.
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