Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
Patent
1984-05-21
1986-04-01
Yasich, Daniel M.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Of susceptibility to thermally induced deteriouration, flaw,...
356445, 374 17, 374130, 374 5, G01N 2141, G01N 2500
Patent
active
045794634
ABSTRACT:
A method and apparatus is disclosed for detecting thermal waves. This system is based on the measurement of the change in reflectivity at the sample surface which is a function of the changing surface temperature. The apparatus includes a radiation probe beam that is directed on a portion of the area which is being periodically heated. A photodetector is aligned to sense the intensity changes in the reflected radiation probe beam which results from the periodic heating. These signals are processed to detect the presence of thermal waves.
REFERENCES:
patent: 3462602 (1969-08-01), Apple
patent: 3930730 (1976-01-01), Laurens et al.
patent: 4243327 (1981-01-01), Frosch et al.
patent: 4255971 (1981-03-01), Rosencwaig
patent: 4283147 (1981-08-01), Dreyfus et al.
patent: 4284356 (1981-08-01), Heilman
patent: 4466748 (1984-08-01), Needham
patent: 4468136 (1984-08-01), Murphy et al.
patent: 4513384 (1985-04-01), Rosencwaig
patent: 4521118 (1985-06-01), Rosencwaig
patent: 4522510 (1985-06-01), Rosencwaig et al.
"Non-Destructive Interferometric Detection of Unbonded Layers", by P. Cielo, pp. 231-248, Reprint of Optics & Lasers in Engineering.
Opsal Jon
Rosencwaig Allan
Smith Walter L.
Willenborg David L.
Therma-Wave Partners
Yasich Daniel M.
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